G. Gauglitz, and W. Nahm. Observation of spectral interferences for the determination of volume and surface effects of thin films. In Fresenius Journal of Analytical Chemistry, vol. 341(3-4) , pp. 279 283, 1991
Abstract:
The application of a rapid scanning diode array spectrometer allows the time-resolved observation of the interferences caused by multiple reflections at the interfaces of thin films. This spectral interferometry enables the observation of changes in optical pathlengths and allows to separate volume-effects like polymer swelling from surface-effects like adsorption or deposition. Polymer/solvent interactions will give an example for an application of this method.
G. Gauglitz, and W. Nahm. Rapid optical sensors for the detection of organic solvent vapors. 1991